Browsing by Author "Senthilkumar, M."
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- Characterization of microroughness parameters in gadolinium oxide thin films: A study based on extended power spectral density analyses(2005) Senthilkumar, M.; Sahoo, N. K.; Thakur, S.; Tokas, R. B.
- Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy(2002) Sahoo, N. K.; Senthilkumar, M.; Thakur, S.; Bhattacharyya, D.
- Determination and analysis of non-linear index profiles in electron-beam-deposited(2005) Sahoo, N. K.; Thakur, S.; Senthilkumar, M.; Das, N. C.
- Observation and analysis of self-organized surface grain structures in silica films under nonepitaxial growth mode(2004) Sahoo, N. K.; Thakur, S.; Senthilkumar, M.; Tokas, R. B.; Das, N. C.
- Optical multilayer post growth instabilities: Analyses of Gd2O3/SiO2 system in combination with scanning probe force spectroscopy(2005) Sahoo, N. K.; Thakur, S.; Senthilkumar, M.
- Optical properties and morphological changes in gadolinia films deposited under ambient substrate temperature conditions(2005) Thakur, S.; Sahoo, N. K.; Senthilkumar, M.; Tokas, R. B.
- Reactive electron beam evaporated gadolinia films at ambient substrate temperature: optical properties and morphology studies(2005) Senthilkumar, M.; Sahoo, N. K.; Thakur, S.; Tokas, R. B.
- Reactive electron beam evaporation of gadolinium oxide optical thin films for ultraviolet and deep ultraviolet laser wavelengths(2003) Sahoo, N. K.; Thakur, S.; Senthilkumar, M.; Bhattacharyya, D.; Das, N. C.
- Surface roughness and interface diffusion studies on thin Mo and W films and Mo/Si and W/Si interfaces(2003) Bhattacharyya, D.; Poswal, A. K.; Senthilkumar, M.; Das, N. C.
- Surface viscoelasticity studies of Gd2O3, SiO2 optical thin films and multilayers using force modulation and force-distance scanning probe microscopy(2003) Sahoo, N. K.; Thakur, S.; Senthilkumar, M.; Das, N. C.