Observation and analysis of self-organized surface grain structures in silica films under nonepitaxial growth mode

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Date

2004

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Abstract

Description

Keywords

Self-organization, Morphology, Atomic force microscopy, Ordered grain structures, Fast Fourier transform, Optical thin film, Glancing incidence X-ray diffraction

Source

Vacuum, 2004. Vol. 77: pp. 87-96

URI

http://hdl.handle.net/123456789/18091

Collections

2004