Observation and analysis of self-organized surface grain structures in silica films under nonepitaxial growth mode

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dc.contributor.authorSahoo, N. K.
dc.contributor.authorThakur, S.
dc.contributor.authorSenthilkumar, M.
dc.contributor.authorTokas, R. B.
dc.contributor.authorDas, N. C.
dc.date.accessioned2019-04-01T05:24:06Z
dc.date.available2019-04-01T05:24:06Z
dc.date.issued2004
dc.description.divisionSpect. Div.en
dc.format.extent4420 bytes
dc.format.mimetypetext/html
dc.identifier.sourceVacuum, 2004. Vol. 77: pp. 87-96en
dc.identifier.urihttp://hdl.handle.net/123456789/18091
dc.language.isoenen
dc.subjectSelf-organizationen
dc.subjectMorphologyen
dc.subjectAtomic force microscopyen
dc.subjectOrdered grain structuresen
dc.subjectFast Fourier transformen
dc.subjectOptical thin filmen
dc.subjectGlancing incidence X-ray diffractionen
dc.titleObservation and analysis of self-organized surface grain structures in silica films under nonepitaxial growth modeen
dc.typeArticleen

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