Characterization of microroughness parameters in gadolinium oxide thin films: A study based on extended power spectral density analyses

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Date

2005

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Abstract

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Keywords

Reactive electron beam evaporation, Surface microroughness, Power spectral density

Source

Applied Surface Science, 2005. Vol. 252: pp. 1608-1619

URI

http://hdl.handle.net/123456789/16771

Collections

2005