Characterization of microroughness parameters in gadolinium oxide thin films: A study based on extended power spectral density analyses

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dc.contributor.authorSenthilkumar, M.
dc.contributor.authorSahoo, N. K.
dc.contributor.authorThakur, S.
dc.contributor.authorTokas, R. B.
dc.date.accessioned2018-08-24T06:18:27Z
dc.date.available2018-08-24T06:18:27Z
dc.date.issued2005
dc.description.divisionSpect. Div.en
dc.format.extent4910 bytes
dc.format.mimetypetext/html
dc.identifier.sourceApplied Surface Science, 2005. Vol. 252: pp. 1608-1619en
dc.identifier.urihttp://hdl.handle.net/123456789/16771
dc.language.isoenen
dc.subjectReactive electron beam evaporationen
dc.subjectSurface microroughnessen
dc.subjectPower spectral densityen
dc.titleCharacterization of microroughness parameters in gadolinium oxide thin films: A study based on extended power spectral density analysesen
dc.typeArticleen

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