Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy

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Date

2002

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Keywords

Gadolinium oxide, Microstructural properties, optical properties, ellipsometry, surface topography, E-beam evaporation

Source

Applied Surface Science, 2002. Vol. 200: pp. 219-230

URI

http://hdl.handle.net/123456789/18808

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2002