Determination and analysis of non-linear index profiles in electron-beam-deposited

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Date

2005

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Abstract

Description

Keywords

Determination and analysis, non-linear index profiles, electron-beam-deposited, Thickness-dependent index non-linearity, thin films

Source

Applied Physics A, 2005. Vol. 80: pp. 829-839

URI

http://hdl.handle.net/123456789/16758

Collections

2005