Determination and analysis of non-linear index profiles in electron-beam-deposited

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dc.contributor.authorSahoo, N. K.
dc.contributor.authorThakur, S.
dc.contributor.authorSenthilkumar, M.
dc.contributor.authorDas, N. C.
dc.date.accessioned2018-08-23T09:49:13Z
dc.date.available2018-08-23T09:49:13Z
dc.date.issued2005
dc.description.divisionSpect. Div.en
dc.format.extent4749 bytes
dc.format.mimetypetext/html
dc.identifier.sourceApplied Physics A, 2005. Vol. 80: pp. 829-839en
dc.identifier.urihttp://hdl.handle.net/123456789/16758
dc.language.isoenen
dc.subjectDetermination and analysisen
dc.subjectnon-linear index profilesen
dc.subjectelectron-beam-depositeden
dc.subjectThickness-dependent index non-linearityen
dc.subjectthin filmsen
dc.titleDetermination and analysis of non-linear index profiles in electron-beam-depositeden
dc.typeArticleen

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