Morphology-dependent electric transport in textured ultrathin Al films grown on Si

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dc.contributor.authorAswal, D. K.
dc.contributor.authorJoshi, N.
dc.contributor.authorDebnath, A. K.
dc.contributor.authorMuthe, K. P.
dc.contributor.authorGupta, S. K.
dc.contributor.authorYakhmi, J. V.
dc.date.accessioned2018-11-02T06:19:43Z
dc.date.available2018-11-02T06:19:43Z
dc.date.issued2005
dc.description.divisionTPPEDen
dc.format.extent4172 bytes
dc.format.mimetypetext/html
dc.identifier.sourceJournal of Applied Physics, 2005. Vol. 98: Article no. 026103en
dc.identifier.urihttp://hdl.handle.net/123456789/17233
dc.language.isoenen
dc.subjectMorphology-dependent electric transporten
dc.subjecttextured ultrathin aluminum metal filmsen
dc.subjectelectrical resistivityen
dc.subjectmolecular-beam epitaxyen
dc.titleMorphology-dependent electric transport in textured ultrathin Al films grown on Sien
dc.typeArticleen

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