Morphology-dependent electric transport in textured ultrathin Al films grown on Si

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Date

2005

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Keywords

Morphology-dependent electric transport, textured ultrathin aluminum metal films, electrical resistivity, molecular-beam epitaxy

Source

Journal of Applied Physics, 2005. Vol. 98: Article no. 026103

URI

http://hdl.handle.net/123456789/17233

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2005