X-ray reflectivity study of bias graded diamond like carbon film synthesized by ECR plasma

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dc.contributor.authorDey, R. M.
dc.contributor.authorDeshpande, S. K.
dc.contributor.authorSingh, S. B.
dc.contributor.authorChand, N.
dc.contributor.authorPatil, D. S.
dc.contributor.authorKulkarni, S. K.
dc.date.accessioned2014-04-16T09:27:52Z
dc.date.available2014-04-16T09:27:52Z
dc.date.issued2013
dc.description.divisionL&PTDen
dc.format.extent4238 bytes
dc.format.mimetypetext/html
dc.identifier.sourceBulletin of Materials Science, 2013. Vol. 36 (1): pp. 9-14en
dc.identifier.urihttp://hdl.handle.net/123456789/9109
dc.language.isoenen
dc.subjectDiamond like carbonen
dc.subjectelectron cyclotron resonanceen
dc.subjectX-ray reflectivityen
dc.subjectroughnessen
dc.subjectsub-plantation modelen
dc.subjectamorphous materialen
dc.titleX-ray reflectivity study of bias graded diamond like carbon film synthesized by ECR plasmaen
dc.typeArticleen

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