Influence of dislocations and grain boundaries on diffraction line profiles of nano-crystalline materials: A numerical study

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dc.contributor.authorNaveen Kumar, N.
dc.contributor.authorMani Krishna, K. V.
dc.contributor.authorChandra, S.
dc.contributor.authorTewari, R.
dc.date.accessioned2021-01-08T06:52:53Z
dc.date.available2021-01-08T06:52:53Z
dc.date.issued2020
dc.description.divisionMSD;MMDen
dc.format.extent4601 bytes
dc.format.mimetypetext/html
dc.identifier.sourceComputational Materials Science, 2020. Vol. 171: Article no. 109213en
dc.identifier.urihttp://hdl.handle.net/123456789/21795
dc.language.isoenen
dc.subjectX-ray diffractionen
dc.subjectMolecular dynamicsen
dc.subjectDislocation densityen
dc.subjectX-ray line profile analysisen
dc.subjectGrain boundariesen
dc.titleInfluence of dislocations and grain boundaries on diffraction line profiles of nano-crystalline materials: A numerical studyen
dc.typeArticleen

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