Influence of dislocations and grain boundaries on diffraction line profiles of nano-crystalline materials: A numerical study

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Date

2020

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Abstract

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Keywords

X-ray diffraction, Molecular dynamics, Dislocation density, X-ray line profile analysis, Grain boundaries

Source

Computational Materials Science, 2020. Vol. 171: Article no. 109213

URI

http://hdl.handle.net/123456789/21795

Collections

2020