Characterization of Ni/Al multilayer on Si substrate by diffraction and reflectometry techniques

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dc.contributor.authorSwain, M.
dc.contributor.authorBasu, Saibal
dc.contributor.authorBhattacharya, D.
dc.contributor.authorGupta, M.
dc.date.accessioned2012-09-21T06:36:27Z
dc.date.available2012-09-21T06:36:27Z
dc.date.issued2012
dc.description.divisionSSPDen
dc.format.extent3671 bytes
dc.format.mimetypetext/html
dc.identifier.sourceAIP Conference Proceedings, 2012. Vol. 1447: pp. 647-648en
dc.identifier.urihttp://hdl.handle.net/123456789/6745
dc.language.isoenen
dc.subjectXRRen
dc.subjectPNRen
dc.titleCharacterization of Ni/Al multilayer on Si substrate by diffraction and reflectometry techniquesen
dc.typeArticleen

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