Characterization of Ni/Zr system by x-ray reflectivity measurements

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dc.contributor.authorBhattacharya, D.
dc.contributor.authorMoundekar, P.
dc.contributor.authorBasu, Saibal
dc.date.accessioned2014-03-28T10:10:23Z
dc.date.available2014-03-28T10:10:23Z
dc.date.issued2013
dc.description.divisionSSPDen
dc.format.extent3737 bytes
dc.format.mimetypetext/html
dc.identifier.sourceAIP Conference Proceedings, 2013. Vol. 1512 (1): pp. 768-769en
dc.identifier.urihttp://hdl.handle.net/123456789/9004
dc.language.isoenen
dc.subjectX-ray reflectometryen
dc.subjectdeposition by sputteringen
dc.subjectmetallic glassesen
dc.titleCharacterization of Ni/Zr system by x-ray reflectivity measurementsen
dc.typeArticleen

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