BARC/PUB/2013/0994

 
 

Characterization of Ni/Zr system by x-ray reflectivity measurements

 
     
 
Author(s)

Bhattacharya, D.; Moundekar, P.; Basu, S.
(SSPD)

Source

AIP Conference Proceedings, 2013. Vol. 1512 (1): pp. 768-769

ABSTRACT

A study of the Ni/Zr system has been undertaken through x-ray reflectivity measurements of Ni-Zr alloy layers and a trilayer sample Ni/Zr/Ni, deposited by a home-built D.C. magnetron sputtering unit. Ni-Zr alloys are known to have high glass-forming ability in a wide range of concentrations and play a significant role in the study of bulk amorphous metallic materials. It was observed that the Ni-Zr alloy formed by co-sputtering was amorphous, and that no interfacial alloys were obtained in the analysis of the trilayer sample.

 
 
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