Composition dependent microstructure and optical properties of boron carbide (BxC) thin films deposited by radio frequency-plasma enhanced chemical vapour deposition technique

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dc.contributor.authorBute, A.
dc.contributor.authorJena, S.
dc.contributor.authorBhattacharya, D.
dc.contributor.authorS. Kumar
dc.contributor.authorChand, N.
dc.contributor.authorKeskar, N.
dc.contributor.authorSinha, S.
dc.date.accessioned2019-05-23T11:10:11Z
dc.date.available2019-05-23T11:10:11Z
dc.date.issued2019
dc.description.divisionL&PSPS;A&MPD;SSPD;MMDen
dc.format.extent4437 bytes
dc.format.mimetypetext/html
dc.identifier.sourceMaterials Research Bulletin, 2019. Vol. 109: pp. 175-182en
dc.identifier.urihttp://hdl.handle.net/123456789/18512
dc.language.isoenen
dc.subjectCarbidesen
dc.subjectOptical materialsen
dc.subjectPlasma depositionen
dc.subjectX-ray diffractionen
dc.titleComposition dependent microstructure and optical properties of boron carbide (BxC) thin films deposited by radio frequency-plasma enhanced chemical vapour deposition techniqueen
dc.typeArticleen

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