Development of rf plasma sputtered Al2O3-TiO2 multilayer broad band antireflecting coatings and its correlation with plasma parameters
dc.contributor.author | Laha, P. | |
dc.contributor.author | Panda, A. B. | |
dc.contributor.author | Mahapatra, S. K. | |
dc.contributor.author | Barhai, P. K. | |
dc.contributor.author | Das, A. K. | |
dc.contributor.author | Banerjee, I. | |
dc.date.accessioned | 2012-07-05T06:19:21Z | |
dc.date.available | 2012-07-05T06:19:21Z | |
dc.date.issued | 2012 | |
dc.description.division | L&PTD | en |
dc.format.extent | 4697 bytes | |
dc.format.mimetype | text/html | |
dc.identifier.source | Applied Surface Science, 2012. Vol. 258: pp. 2275-2282 | en |
dc.identifier.uri | http://hdl.handle.net/123456789/6263 | |
dc.language.iso | en | en |
dc.subject | Al2O3 | en |
dc.subject | TiO2 | en |
dc.subject | X-ray photoemission spectroscopy (XPS) | en |
dc.subject | PL | en |
dc.subject | Optical properties | en |
dc.subject | OES | en |
dc.title | Development of rf plasma sputtered Al2O3-TiO2 multilayer broad band antireflecting coatings and its correlation with plasma parameters | en |
dc.type | Article | en |