A four channel time-to-digital converter ASIC with in-built calibration and SPI interface

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Date

2014

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Abstract

Description

Keywords

Time-to-digital conversion(TDC), Vernier method, Aplication specific integrated circuit(ASIC), PVT, Calibration, SPI

Source

Nuclear Instruments & Methods in Physics Research-A, 2014. Vol. 737: pp. 117-121

URI

http://hdl.handle.net/123456789/9861

Collections

2014