H2S sensors based on SnO2 films: RGTO verses RF sputtering

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dc.contributor.authorKaur, M.
dc.contributor.authorRamgir, N. S.
dc.contributor.authorGautam, U. K.
dc.contributor.authorGanapathi, S. K.
dc.contributor.authorBhattacharya, S.
dc.contributor.authorDatta, N.
dc.contributor.authorSaxena, V.
dc.contributor.authorDebnath, A. K.
dc.contributor.authorAswal, D. K.
dc.contributor.authorGupta, S. K.
dc.date.accessioned2015-06-09T09:56:15Z
dc.date.available2015-06-09T09:56:15Z
dc.date.issued2014
dc.description.divisionTPDen
dc.format.extent4689 bytes
dc.format.mimetypetext/html
dc.identifier.sourceMaterials Chemistry & Physics, 2014. Vol. 147 (3): pp. 707-714en
dc.identifier.urihttp://hdl.handle.net/123456789/11178
dc.language.isoenen
dc.subjectThin filmsen
dc.subjectVacuum depositionen
dc.subjectDefectsen
dc.subjectSurface propertiesen
dc.titleH2S sensors based on SnO2 films: RGTO verses RF sputteringen
dc.typeArticleen

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