Investigations on Substrate Temperature-Induced Growth Modes of Organic Semiconductors at Dielectric/semiconductor Interface and Their Correlation with Threshold Voltage Stability in Organic Field-Effect Transistors
dc.contributor.author | Padma, N. | |
dc.contributor.author | Maheshwari, P. | |
dc.contributor.author | Bhattacharya, D. | |
dc.contributor.author | Tokas, R. B. | |
dc.contributor.author | Sen, S. | |
dc.contributor.author | Honda, Y. | |
dc.contributor.author | Basu, Saibal | |
dc.contributor.author | Pujari, P. K. | |
dc.contributor.author | Chandrasekhar Rao, T. V. | |
dc.date.accessioned | 2016-06-24T06:14:38Z | |
dc.date.available | 2016-06-24T06:14:38Z | |
dc.date.issued | 2016 | |
dc.description.division | TPD;RCD;SSPD;A&MPD | en |
dc.format.extent | 4853 bytes | |
dc.format.mimetype | text/html | |
dc.identifier.source | ACS Applied Materials and Interfaces, 2016. Vol. 8 (5): pp. 3376-3385 | en |
dc.identifier.uri | http://hdl.handle.net/123456789/13187 | |
dc.language.iso | en | en |
dc.subject | OFET | en |
dc.subject | substrate temperature | en |
dc.subject | growth mode of CuPc | en |
dc.subject | threshold voltage stability | en |
dc.subject | positron annihilation spectroscopy | en |
dc.subject | X ray reflectivity | en |
dc.title | Investigations on Substrate Temperature-Induced Growth Modes of Organic Semiconductors at Dielectric/semiconductor Interface and Their Correlation with Threshold Voltage Stability in Organic Field-Effect Transistors | en |
dc.type | Article | en |