Investigations on Substrate Temperature-Induced Growth Modes of Organic Semiconductors at Dielectric/semiconductor Interface and Their Correlation with Threshold Voltage Stability in Organic Field-Effect Transistors

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Date

2016

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Keywords

OFET, substrate temperature, growth mode of CuPc, threshold voltage stability, positron annihilation spectroscopy, X ray reflectivity

Source

ACS Applied Materials and Interfaces, 2016. Vol. 8 (5): pp. 3376-3385

URI

http://hdl.handle.net/123456789/13187

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2016