Thickness dependent structural and magnetic properties of Au/Co/Si (100) ultrathin wedge film

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dc.contributor.authorTripathi, J.
dc.contributor.authorSharma, A.
dc.contributor.authorBisen, R.
dc.contributor.authorTripathi, S.
dc.date.accessioned2020-02-24T11:18:51Z
dc.date.available2020-02-24T11:18:51Z
dc.date.issued2019
dc.description.divisionA&MPDen
dc.format.extent4349 bytes
dc.format.mimetypetext/html
dc.identifier.sourceAIP Conference Proceedings, 2019. Vol. 2115: Article no. 030305en
dc.identifier.urihttp://hdl.handle.net/123456789/20349
dc.language.isoenen
dc.subjectThickness dependent structural and magnetic propertiesen
dc.subjectAu/Co/Si (100) ultrathin wedge filmen
dc.subjectIon Beam Sputtering (IBS) techniqueen
dc.subjectX-ray diffraction measurementen
dc.titleThickness dependent structural and magnetic properties of Au/Co/Si (100) ultrathin wedge filmen
dc.typeArticleen

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