Thickness dependent structural and magnetic properties of Au/Co/Si (100) ultrathin wedge film

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Date

2019

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Keywords

Thickness dependent structural and magnetic properties, Au/Co/Si (100) ultrathin wedge film, Ion Beam Sputtering (IBS) technique, X-ray diffraction measurement

Source

AIP Conference Proceedings, 2019. Vol. 2115: Article no. 030305

URI

http://hdl.handle.net/123456789/20349

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2019