Effect of sputtering power on MgF2 thin films deposited by sputtering technique under fluorine trapping
No Thumbnail Available
Click here to download
Date
2016
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
Description
Keywords
Sputtering, X-ray diffraction, Refractive index
Source
AIP Conference Proceedings, 2016. Vol. 1731: pp. 080078.1-080078.3