Structural phase transition of ternary dielectric SmGdO3: Evidence from angle dispersive x-ray diffraction and Raman spectroscopic studies

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dc.contributor.authorSharma, Y.
dc.contributor.authorSahoo, S.
dc.contributor.authorMishra, A. K.
dc.contributor.authorMisra, P.
dc.contributor.authorPavunny, S. P.
dc.contributor.authorDwivedi, A.
dc.contributor.authorSharma, S. M.
dc.contributor.authorKatiyar, R. S.
dc.date.accessioned2015-11-16T09:04:01Z
dc.date.available2015-11-16T09:04:01Z
dc.date.issued2015
dc.description.divisionHP&SRPDen
dc.format.extent4222 bytes
dc.format.mimetypetext/html
dc.identifier.sourceJournal of Applied Physics, 2015. Vol. 117 (9): pp. 094101.1-094101.5en
dc.identifier.urihttp://hdl.handle.net/123456789/11862
dc.language.isoenen
dc.subjectStructural phase transitionen
dc.subjectternary dielectric SmGdO3en
dc.subjectangle dispersive x-ray diffractionen
dc.subjectRaman spectroscopic studyen
dc.titleStructural phase transition of ternary dielectric SmGdO3: Evidence from angle dispersive x-ray diffraction and Raman spectroscopic studiesen
dc.typeArticleen

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