BARC/PUB/2015/0194

 
 

Structural phase transition of ternary dielectric SmGdO3: Evidence from angle dispersive x-ray diffraction and Raman spectroscopic studies

 
     
 
Author(s)

Sharma, Y.; Sahoo, S.; Mishra, A. K.; Misra, P.; Pavunny, S. P.; Dwivedi, A.; Sharma, S. M.; Katiyar, R. S.
(HP&SRPD)

Source

Journal of Applied Physics, 2015. Vol. 117 (9): pp. 094101.1-094101.5

ABSTRACT

High-pressure synchrotron based angle dispersive x-ray diffraction (ADXRD) studies were carried out on SmGdO3 (SGO) up to 25.7GPa at room temperature. ADXRD results indicated a reversible pressure-induced phase transition from ambient monoclinic to hexagonal phase at ~ 8.9GPa. The observed pressure-volume data were fitted with the third order Birch-Murnaghan equation of state yielding zero pressure bulk modulus B0=132(22) and 177(9) GPa for monoclinic (B-type) and hexagonal (A-type) phases, respectively. Pressure dependent micro-Raman spectroscopy further confirmed the monoclinic to hexagonal phase transition at about 5.24GPa. The mode Grüneisen pa-rameters and pressure coefficients for different Raman modes corresponding to each individual phases of SGO were calculated using pressure dependent Raman mode analysis.

 
 
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