Study of structural, optical and electrical properties of gamma irradiated In2O3 thin films for device applications

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Date

2017

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Keywords

Study of structural, optical and electrical properties, gamma irradiated In2O3 thin films, device applications, X-ray diffraction analysis

Source

Journal of Materials Science: Materials in Electronics, 2017. Vol. 28 (6): pp. 4619-4624

URI

http://hdl.handle.net/123456789/15036

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2017