Deposition of Optical Quality Cu/Ti Films

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dc.contributor.authorSwain, M.
dc.contributor.authorBhattacharya, D.
dc.contributor.authorBasu, Saibal
dc.date.accessioned2015-05-15T10:03:47Z
dc.date.available2015-05-15T10:03:47Z
dc.date.issued2014
dc.description.divisionSSPDen
dc.format.extent3823 bytes
dc.format.mimetypetext/html
dc.identifier.sourceAIP Conference Proceedings, 2014. Vol. 1591: pp. 946-947en
dc.identifier.urihttp://hdl.handle.net/123456789/11027
dc.language.isoenen
dc.subjectMultilayeren
dc.subjectX-Ray Reflectometryen
dc.subjectInterface structure and roughnessen
dc.titleDeposition of Optical Quality Cu/Ti Filmsen
dc.typeArticleen

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