Distribution of multiple intrinsic defects in C doped α-Al2O3

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dc.contributor.authorRao, K. S.
dc.contributor.authorSalunke, H. G.
dc.contributor.authorMuthe, K. P.
dc.contributor.authorKulkarni, M. S.
dc.date.accessioned2020-03-06T09:40:39Z
dc.date.available2020-03-06T09:40:39Z
dc.date.issued2019
dc.description.divisionRSSDen
dc.format.extent3846 bytes
dc.format.mimetypetext/html
dc.identifier.sourceAIP Conference Proceedings, 2019. Vol. 2115: Article no. 030356en
dc.identifier.urihttp://hdl.handle.net/123456789/20386
dc.language.isoenen
dc.subjectMultiple Intrinsic Defectsen
dc.subjectCarbon doped aluminaen
dc.subjecthighly sensitive Optically Stimulated Dosimeter(OSL) phosphoren
dc.subjectC atomsen
dc.titleDistribution of multiple intrinsic defects in C doped α-Al2O3en
dc.typeArticleen

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