Total reflection X-ray fluorescence analysis of high purity quartz: A bottom-up approach of uncertainty evaluation

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dc.contributor.authorRemya Devi, P. S.
dc.contributor.authorChavan, T. A.
dc.contributor.authorGhosh, M.
dc.contributor.authorSwain, K. K.
dc.date.accessioned2022-01-27T05:44:00Z
dc.date.available2022-01-27T05:44:00Z
dc.date.issued2021
dc.description.divisionACDen
dc.format.extent4558 bytes
dc.format.mimetypetext/html
dc.identifier.sourceSpectrochimica Acta-B, 2021. Vol. 178: Article no. 106127en
dc.identifier.urihttp://hdl.handle.net/123456789/23914
dc.language.isoenen
dc.subjectTotal reflection X-ray fluorescenceen
dc.subjectQuartzen
dc.subjectUncertaintyen
dc.subjectAccuracyen
dc.subjectDetection limiten
dc.titleTotal reflection X-ray fluorescence analysis of high purity quartz: A bottom-up approach of uncertainty evaluationen
dc.typeArticleen

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