Total reflection X-ray fluorescence analysis of high purity quartz: A bottom-up approach of uncertainty evaluation

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Date

2021

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Keywords

Total reflection X-ray fluorescence, Quartz, Uncertainty, Accuracy, Detection limit

Source

Spectrochimica Acta-B, 2021. Vol. 178: Article no. 106127

URI

http://hdl.handle.net/123456789/23914

Collections

2021