High-precision determination of Si-neutron coherent scattering length with a dual non-dispersive sample

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dc.contributor.authorAbbas, S.
dc.contributor.authorWagh, A. G.
dc.contributor.authorLemmel, H.
dc.contributor.authorPotocar, T.
dc.contributor.authorRauch, H.
dc.date.accessioned2012-11-08T08:16:16Z
dc.date.available2012-11-08T08:16:16Z
dc.date.issued2012
dc.description.divisionSSPDen
dc.format.extent3630 bytes
dc.format.mimetypetext/html
dc.identifier.sourceAIP Conference Proceedings, 2012. Vol. 1447: pp. 479-480en
dc.identifier.urihttp://hdl.handle.net/123456789/6760
dc.language.isoenen
dc.subjectNeutron interferometryen
dc.subjectBragg planesen
dc.subjectCoherent scattering lengthen
dc.subjectNon-dispersive phaseen
dc.titleHigh-precision determination of Si-neutron coherent scattering length with a dual non-dispersive sampleen
dc.typeArticleen

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