Abbas, S.; Wagh, A. G.; Lemmel, H.; Potocar, T.; Rauch, H. (SSPD)
Source
AIP Conference Proceedings, 2012. Vol. 1447: pp. 479-480
ABSTRACT
We report here our new interferometric measurements of neutron coherent scattering length bC for silicon using a better polished dual non-dispersive sample. We have measured a large and exactly non-dispersive phase by this method to within 1 part in 106 and determined the silicon bC to within a few parts in 105.