Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique

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dc.contributor.authorSahoo, Naba K.
dc.contributor.authorTokas, Raj B.
dc.contributor.authorThakur, Sudhakar
dc.date.accessioned2007-09-17T10:25:08Z
dc.date.available2007-09-17T10:25:08Z
dc.date.issued2006
dc.format.extent4147 bytes
dc.format.mimetypetext/html
dc.identifier.urihttp://hdl.handle.net/123456789/554
dc.language.isoenen
dc.subjectOptical coatingsen
dc.subjectCodepositionen
dc.subjectElectron beam evaporationen
dc.subjectThin film multilayersen
dc.subjectEllipsometryen
dc.subjectSpectrophotometryen
dc.subjectAtomic force microscopyen
dc.subjectGd2O3 compositeen
dc.subjectSiO2 compositeen
dc.subjectTauc–Lorentz formulationsen
dc.titleAnalysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric techniqueen
dc.typeArticleen

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