Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique
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Date
2006
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Optical coatings, Codeposition, Electron beam evaporation, Thin film multilayers, Ellipsometry, Spectrophotometry, Atomic force microscopy, Gd2O3 composite, SiO2 composite, Tauc–Lorentz formulations