On the suitability of peak profile analysis models for estimating dislocation density

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dc.contributor.authorKarri, M.
dc.contributor.authorSingh, J. B.
dc.contributor.authorMani Krishna, K. V.
dc.contributor.authorKumawat, B. K.
dc.contributor.authorNaveen Kumar
dc.contributor.authorSrivastava, D.
dc.date.accessioned2018-01-12T06:39:53Z
dc.date.available2018-01-12T06:39:53Z
dc.date.issued2017
dc.description.divisionMMD;MSDen
dc.format.extent5020 bytes
dc.format.mimetypetext/html
dc.identifier.sourceMaterials Science and Engineering-A, 2017. Vol. 700: pp. 75-81en
dc.identifier.urihttp://hdl.handle.net/123456789/15467
dc.language.isoenen
dc.subjectX-ray diffractionen
dc.subjectTransmission electron microscopyen
dc.subjectDislocation densityen
dc.subjectPeak profile analysisen
dc.subjectVariance methodsen
dc.titleOn the suitability of peak profile analysis models for estimating dislocation densityen
dc.typeArticleen

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