On the suitability of peak profile analysis models for estimating dislocation density

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Date

2017

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Keywords

X-ray diffraction, Transmission electron microscopy, Dislocation density, Peak profile analysis, Variance methods

Source

Materials Science and Engineering-A, 2017. Vol. 700: pp. 75-81

URI

http://hdl.handle.net/123456789/15467

Collections

2017