Defect profiling in organic semiconductor multilayers

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Date

2012

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Volume Title

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Abstract

Description

Keywords

Positron annihilation spectroscopy, Organic semiconductors heterostructures, Interfaces, Defects

Source

Organic Electronics, 2012. Vol. 13 (8): pp. 1409-1419

URI

http://hdl.handle.net/123456789/6910

Collections

2012