Browsing by Author "Date, K."
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- Effect of leakage current and dielectric constant on single and double layer oxides in MOS structure(2010) Laha, P.; Panda, A. B.; Dahiwale, S.; Date, K.; Patil, K. R.; Barhai, P. K.; Das, A. K.; Banerjee, I.; Mahapatra, S. K.