Deshmukh, A. V.Patil, S. I.Yusuf, S. M.Rajarajan, A. K.Lalla, N. P.2011-01-182011-01-182010Journal of Magnetism and Magnetic Materials. Vol. 322 (5): pp. 536-541http://hdl.handle.net/123456789/41404391 bytestext/htmlenDopingX-ray diffractionTransmission electron microscopy(TEM)Magnetization measurementStructural, chemical and magnetic investigations of polycrystalline Zn1-xMnxOArticle