Biswas, D.Singh, G.Sarkar, S. G.2019-02-142019-02-142018Ultramicroscopy, 2018. Vol. 185: pp. 1-4http://hdl.handle.net/123456789/177593660 bytestext/htmlenfield enhancement factoremitter tipFowler–Nordheim like formulationvacuum nanoelectronicsVariation of field enhancement factor near the emitter tipArticle