Optical multilayer post growth instabilities: Analyses of Gd2O3/SiO2 system in combination with scanning probe force spectroscopy

Sahoo, N. K.Thakur, S.Senthilkumar, M.2018-08-242018-08-242005Applied Surface Science, 2005. Vol. 252: pp. 1520-1537http://hdl.handle.net/123456789/167704642 bytestext/htmlenDeep UV optical coatingsMultilayer instabilityForce–distance spectroscopySpectrophotometryOptical multilayer post growth instabilities: Analyses of Gd2O3/SiO2 system in combination with scanning probe force spectroscopyArticle