Naveen Kumar, N.Mani Krishna, K. V.Chandra, S.Tewari, R.2021-01-082021-01-082020Computational Materials Science, 2020. Vol. 171: Article no. 109213http://hdl.handle.net/123456789/217954601 bytestext/htmlenX-ray diffractionMolecular dynamicsDislocation densityX-ray line profile analysisGrain boundariesInfluence of dislocations and grain boundaries on diffraction line profiles of nano-crystalline materials: A numerical studyArticle