Biswas, A.Siegel, D. J.Seidman, D. N.2011-06-142011-06-142010Physical Review Letters. Vol. 105: pp. 076102.1-076102.4http://hdl.handle.net/123456789/48484369 bytestext/htmlenSimultaneous SegregationCoherentSemicoherent Heterophase Interfacesthree-dimensional atom-probe tomographyfirst-principles calculationsSimultaneous Segregation at Coherent and Semicoherent Heterophase InterfacesArticle