Characterization of Ni/Al multilayer on Si substrate by diffraction and reflectometry techniques

Swain, M.Basu, SaibalBhattacharya, D.Gupta, M.2012-09-212012-09-212012AIP Conference Proceedings, 2012. Vol. 1447: pp. 647-648http://hdl.handle.net/123456789/67453671 bytestext/htmlenXRRPNRCharacterization of Ni/Al multilayer on Si substrate by diffraction and reflectometry techniquesArticle