Balakrishnan, G.Sundari, S. T.Kuppusami, P.Mohan, P. C.Srinivasan, M. P.Mohandas, E.Ganesan, V.Sastikumar, D.2011-09-282011-09-282011Thin Solid Films, 2011. Vol. 519 (8): pp. 2520-2526http://hdl.handle.net/123456789/51294676 bytestext/htmlenX-ray diffractionThin filmsCerium oxidePulsed laser depositionEllipsometryA study of microstructural and optical properties of nanocrystalline ceria thin films prepared by pulsed laser depositionArticle