Gupta, D.Veerender, P.Sridevi, C.Koiry, S. P.Jha, P.Chauhan, A. K.2023-11-282023-11-282023Applied Physics-A, 2023. Vol. 129: Article no. 127http://hdl.handle.net/123456789/261524198 bytestext/htmlenElectroluminescenceBias voltageCation defect migrationPerovskite degradationStudy of bias-induced degradation mechanism in perovskite CH3NH3PbI3-xClx solar cells by electroluminescence spectroscopyArticle