Characterization of Ni/Zr system by x-ray reflectivity measurements

Bhattacharya, D.Moundekar, P.Basu, Saibal2014-03-282014-03-282013AIP Conference Proceedings, 2013. Vol. 1512 (1): pp. 768-769http://hdl.handle.net/123456789/90043737 bytestext/htmlenX-ray reflectometrydeposition by sputteringmetallic glassesCharacterization of Ni/Zr system by x-ray reflectivity measurementsArticle