Non-destructive elemental depth profiling of Ni/Ti multilayers by GIXRF technique

Biswas, A.Abharana, N.Jha, S. N.Bhattacharyya, D.2021-12-132021-12-132021Applied Surface Science, 2021. Vol. 542: Article no. 148733http://hdl.handle.net/123456789/236884624 bytestext/htmlenGIXRFGIXRRDepth profilingNi/Ti multilayerElement specific diffusionNon-destructive elemental depth profiling of Ni/Ti multilayers by GIXRF techniqueArticle